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The First International Conference on Sensor Device Technologies and Applications
SENSORDEVICES 2010
July 18 - 25, 2010 - Venice/Mestre, Italy |
SENSORDEVICES Advisory Chairs
Petre Dini, IARIA / Concordia University, Canada
Vittorio Ferrari, Università di Brescia, Italy
Elena Gaura, Coventry University, UK
Sergey Yurish, Universitat Politècnica de Catalunya - Barcelona, Spain
SENSORDEVICES 2010 Industry Liaison Chairs
George Abramchuck, Measurement Technology & Advanced Applications -Toronto, Canada
Arvind K. Srivastava, NanoSonix Inc., USA
Aurel Ymeti, OSTENDUM-Enschede, The Netherlands
Qing Zhu, FUJIFILM Dimatix, Inc. - Santa Clara, USA
SENSORDEVICES 2010 Research/Industry Chairs
Tan Yen Kheng, National University of Singapore, Singapore
Michele Penza, ENEA/ Brindisi Research Center, Italy
Martin Pumera, Nanyang Technological University (NTU), Japan
John L. Schmalzel, NASA (IPA) / Rowan University, USA
Raluca - Ioana Stefan-van Staden, National Institute of Research for Electrochemistry and Condensed Matter, Bucharest, Romania
Alberto Yúfera, Centro Nacional de Microelectronica (CNM-CSIC) - Sevilla, Spain
SENSORDEVICES 2010 Technical Program Committee
George Abramchuck, Measurement Technology & Advanced Applications -Toronto, Canada
Francisco Javier Arcega Solsona, University of Zaragoza, Spain
Selcuk Atalay, Inonu University-Malatya, Turkey
Vygantas Augutis, Kaunas University of Technology, Lithuania
Faruk Bagci, University of Augsburg, Germany
Karabi Biswas, Indian Institute of Technology - Kharagpur, India
Mounir Bousbia-Salah, University of Annaba, Algeria
James Brusey, Coventry University, UK
Jaime Calvo-Gallego, University of Salamanca, Spain
Luigi Campanella, University La Sapienza, Italy
Vítor Carvalho, Minho University, Portugal
Danny Chung, Chung Yuan Christian University, Taiwan
Rodrigo P.B. Costa-Felix, INMETRO, Brazil
Yaping Dan, Harvard University, School of Engineering and Applied Science, Cambridge, USA
Petre Dini, IARIA / Concordia University, Canada
Alexandar Djordjevich, City University of Hong Kong, Hong Kong
Snezana Djuric, University of Novi Sad, Serbia
Hua Dong, University of California at Davis, USA
Stefan Enderle, qfix robotics, GmbH Germany
Hector Erives, New Mexico Tech (NMT), USA
Vittorio Ferrari, Università di Brescia, Italy
Elena Gaura, Coventry University, UK
Hao Gong, University of Singapore, Singapore
Graça Maria Henriques Minas, Universidade do Minho - Guimaraes, Portugal
Wilmar Hernandez, Universidad Politecnica de Madrid, Spain
Liudi Jiang, University of Southampton - Highfield, UK
Ding Jianning, Jiangsu Polytechnic University, China
Tan Yen Kheng, National University of Singapore, Singapore
Ganesh Krishnamoorthy, The University of Texas at Austin, USA
Arun Kumar, University of South Florida, USA
Xian-Fang Li, Central South University - Changsha, China
Aihua Liu, University of Oklahoma, USA
Songqin Liu, Southeast University, Nanjing, China
Carlos Lodeiro Espino, University of Vigo, Spain
Jerzy Lukaszewicz, Nicholas Copernicus University - Torun, Poland
Hamed Sadeghian Marnani, Delft University of Technology, The Netherlands
Gerard C.M. Meijer, Delft University of Technology, The Netherlands
Mahmoud Moghavvemi, University of Malaya, Malaysia
Esteban Molina Flores, Benemirita Universidad Autonoma de Puebla, Mexico
Gaidi Mounir, Centre de Recherche et de technologies de l'Energie (CRTEn) Technopole Borj Cédria, Tunisia
Subhas Chandra Mukhopadhyay, Massey University (Manawatu), Palmerston North, New Zealand
Lalchand A. Patil, North Maharashtra University, India
Michele Penza, ENEA/ Brindisi Research Center, Italy
Robert J. Prance, University of Sussex - Brighton, UK
Martin Pumera, National Institute for Materials Science - Biomaterials Center / International Center for Materials Nanoarchitectonics (MANA) - Tsukuba, Japan
K. Rajanna, Indian Institute of Science - Bangalore, India
Càndid Reig, University of Valencia, Spain
Maria Teresa Restivo, University of Porto, Portugal
K. Sapozhnikova, D. I. Mendeleyev Institute for Metrology - St. Petersburg, Russia
Yuriy S. Shmaliy, Guanajuato University - Palo-Blanco, Mexico
John L. Schmalzel, NASA (IPA) / Rowan University, USA
Inamuddin Siddiqui, Aligarh Muslim University, India
Subodh Kumar Singhal, National Physical Laboratory - New Delhi, India
Arvind K. Srivastava, NanoSonix Inc., USA
Nickolaj Starodub, National University of Life and Environmental Sciences of Ukraine, / T. Shevchenko Kiev State University of Ukraine, Ukraine
Raluca-Ioana Stefan-van Staden, National Institute of Research for Electrochemistry and Condensed Matter, Bucharest, Romania
Raman Suri, Head-Biosensor Group/Institute of Microbial Technology - Chandigarh, India
Roman Szewczyk, Industrial Research Institute for Automation and Measurements (PIAP), Poland
R. Taymanov, D. I. Mendeleyev Institute for Metrology - St. Petersburg, Russia
Gui Yun Tian, University of Newcastle upon Tyne - Newcastle, UK
Antonio Valente, UTAD - University of Trás-os-Montes and Alto Douro, Portugal
Manuela Vieira, ISEL, Portugal
Dongfang Yang, National Research Council Canada - London, Canada
Xiaoling Yang, The University of Illinois at Urbana-Champaign, USA
Aurel Ymeti, OSTENDUM-Enschede, The Netherlands
Alberto Yúfera, Centro Nacional de Microelectronica (CNM-CSIC) - Sevilla, Spain
Sergey Yurish, Universitat Politècnica de Catalunya - Barcelona, Spain
Cyrus Zamani, Universitat de Barcelona, Spain
Weiping Zhang, Institute of Micro and Nano Science and Technology / Shanghai Jiao Tong University, China
Xueji Zhang, EMBA / World Precision Instruments, Inc. USA; University of South Florida, USA
Qitao Zhao, University of Texas at Arlington, USA
Qing Zhu, FUJIFILM Dimatix, Inc. - Santa Clara, USA