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The Fifth International Conference on Sensor Device Technologies and Applications
SENSORDEVICES 2014
November 16 - 20, 2014 - Lisbon, Portugal |
SENSORDEVICES Advisory Chairs
Sergey Y. Yurish, International Frequency Sensor Association (IFSA), Spain
Petre Dini, Concordia University, Canada / China Space Agency Center, China
Elena Gaura, Coventry University, UK
Vittorio Ferrari, Università di Brescia, Italy
SENSORDEVICES 2014 Research/Industry Chairs
Raluca - Ioana Stefan-van Staden, National Institute of Research for Electrochemistry and Condensed Matter, Bucharest, Romania
Alberto Yúfera, Centro Nacional de Microelectronica (CNM-CSIC) - Sevilla, Spain
SENSORDEVICES Special Area Chairs
Ultrasonic and piezoelectric sensors
Thomas Herzog, Fraunhofer Institute for Non-Destructive Testing IZFP - Dresden, Germany
Henning Heuer, Fraunhofer Institute for Non-Destructive Testing IZFP - Dresden, Germany
Optical sensors
Vítor Carvalho, Minho University, Portugal
Irinela Chilibon, National Institute of Research and Development for Optoelectronics - Bucharest, Romania
Gas sensors
Dongfang Yang, National Research Council Canada - London, Canada
Nanosensors
Marco Tartagni, University of Bologna - Cesena, Italy
Testing and validation
Ksenia V. Sapozshnikova D.I. Mendeleyev Institute for Metrology - St. Petersburg, Russia
Vibration sensors
Subodh Kumar Singhal, National Physical Laboratory, New Delhi, India
SENSORDEVICES 2014 Technical Program Committee
Farid Amirouche, University of Illinois at Chicago, USA
Ammar Aryan, Université de Caen Basse-Normandie, France
Selcuk Atalay, Inonu University - Malatya, Turkey
Francisco Javier Arcega Solsona, University of Zaragoza, Spain
Debjyoti Banerjee, Texas A&M University, U.S.A.
Matthias Bartholmai, BAM Federal Institute for Materials Research and Testing, Germany
Sukumar Basu, Jadavpur University - Kolkata, India
Juarez Bento da Silva, Universidade Federal de Santa Catarina, Brazil
Daniel Berckmans, Katholieke Universiteit Leuven, Belgium
Partha Bhattacharyya, Bengal Engineering and Science University, West Bengal, India
Virginie Blondeau-Patissier, Université de Franche-Comté, France
Michal Borecki, Warsaw University of Technology, Poland
Jaime Calvo-Gallego, University of Salamanca - Zamora, Spain
Cristina Carmona-Duarte, University of Las Palmas de Gran Canaria, Spain
Vítor Carvalho, Minho University, Portugal
Gustavo Cerda-Villafaña, University of Guanajuato, Mexico
Sudhir Chandra, Indian Institute of Technology Delhi - New Delhi, India
Irinela Chilibon, National Institute of R&D for Optoelectronics - Bucharest-Magurele, Romania
Jeong-Woo Choi, Sogang University - Seoul, Korea
Caterina Ciminelli, Politecnico of Bari, Italy
Alberto Corigliano, Politecnico di Milano, Italy
Rodrigo P.B. Costa-Felix, INMETRO, Brazil
Anna Cysewska-Sobusiak, Poznan University of Technology, Poland
Boris Zaitsev Davydovich, Russian Academy of Sciences - Saratov Branch, Russia
Francesco De Leonardis, Politecnico di Bari, Italy
Matthieu Denoual, GREYC-ENSICAEN, France
Dermot Diamond, Dublin City University, Ireland
Alexandar Djordjevich, City University of Hong Kong, Hong Kong
Alessandro Fantoni, UNINOVA-CTS, Portugal
Miguel Fernandes, UNINOVA - Caparica, Portugal
Vittorio Ferrari, Università di Brescia, Italy
Masato Futagawa, Toyohashi University of Technology, Japan
Noureddine Gabouze, CRTSE (exUDTS), Algeria
Juan Carlos García García, University of Alcalá, Spain
Arfan Ghani, University of Bolton, UK
Friederike Gruhl, Karlsruhe Institute of Technology (KIT), Germany
Vinod Kumar Gupta, Indian Institute of Technology Roorkee, India
Jong-in Hahm, Georgetown University - Washington DC, USA
Jan Havlík, Czech Technical University in Prague, Czech Republic
Thomas Herzog, Fraunhofer Institute for Non-Destructive Testing IZFP - Dresden, Germany
Henning Heuer, Fraunhofer Institute for Non-Destructive Testing IZFP - Dresden, Germany
Eiji Higurashi, University of Tokyo, Japan
Gotan Hiralal Jain, KTHM College, India
Sandeep K. Jha, Indian Institute of Technology Delhi, India
Vladan Koncar, ENSAIT Research, France
Vladimir Laukhin, Institució Catalana de Recerca i Estudis Avançats (ICREA / Institut de Ciencia de Materials de Barcelona (ICMAB-CSIC) - Barcelona, Spain
Elena Laukhina, Networking Research Center on Bioenginering, Biomaterials and Nanomedicine (CIBER-BBN) - Bellaterra, Spain
Yann-Aël Le Borgne, Université Libre de Bruxelles, Belgium
Kevin Lee, Murdoch University, Australia
Aihua Liu, Qingdao Institute of Bioenergy & Bioprocess Technology, Chinese Academy of Sciences, China
Kenneth J. Loh, University of California - Davis, USA
Salvatore A. Lombardo, CNR-IMM - Catania, Italy
Jerzy P. Lukaszewicz, Nicholas Copernicus University - Torun, Poland
Mai S. Mabrouk, Misr University for Science and Technology, Egypt
Emanuela Marasco, West Virginia University, USA
Stefano Mariani, Politecnico di Milano, Italy Iren Kuznetsova, Russian Academy of Sciences - Saratov Branch, Russia
Hamed Sadeghian Marnani, Delft University of Technology, The Netherlands
Vlad Marsic, Cranfield University, U.K.
Marek Miskowicz, AGH University of Science and Technology - Cracow, Poland
Tarek Mohammad, University of Western Ontario - London, Canada
Gaidi Mounir, Centre de Recherches et des Technologies de l'Energie (CRTEn), Tunisie
Eros Pasero, Politecnico di Torino, Italy
Vittorio M.N. Passaro, Politecnico di Bari, Italy
Radislav A. Potyrailo, GE Global Research Center, U.S.A.
Konandur Rajanna, Indian Institute of Science - Bangalore, India
Càndid Reig, University of Valencia, Spain
Teresa Restivo, University of Porto, Portugal
Marcos A Rodrigues, Sheffield Hallam University, UK
Aldo Romani, University of Bologna, Italy
Nicholas Ruth, Ryerson University, Canada
Mounir Bousbia Salah, University of Annaba, Algeria
Ksenia V. Sapozshnikova D.I. Mendeleyev Institute for Metrology - St. Petersburg, Russia
Majid Sarrafzadeh, University of California Los Angeles, U.S.A.
Tapio Seppänen, University of Oulu, Finland
Subodh Kumar Singhal, National Physical Laboratory - New Delhi, India
Junho Song, Sunnybrooke Research Institutes/University of Toronto, Canada
Nickolaj Starodub, National University of Life and Environmental Sciences of Ukraine, / T. Shevchenko Kiev State University of Ukraine, Ukraine
Arndt Steinke, CiS Forschungsinstitut für Mikrosensorik und Photovoltaik GmbH - Erfurt, Germany Raluca - Ioana Stefan-van Staden, National Institute of Research for Electrochemistry and Condensed Matter, Bucharest, Romania
Chelakara S. Subramanian, Florida Institute of Technology - Melbourne, USA
Roman Szewczyk, Warsaw University of Technology, Poland
Marco Tartagni, University of Bologna - Cesena, Italy
Roald Taymanov, D.I.Mendeleyev Institute for Metrology, Russia
Reshef Tenne, Weizmann Institute, Israel
Vicente Traver Salcedo, ITACA-Universitat Politècnica de València, Spain
Carlos M. Travieso-González, University of Las Palmas de Gran Canaria, Spain
Pankaj Vadgama, Queen Mary University of London, U.K.
Antonio Valente, University of Trás-os-Montes and Alto Douro (UTAD) - Vila Real, Portugal
Manuela Vieira, UNINOVA/ISEL, Portugal
Winfried Vonau, Kurt-Schwabe-Institut für Mess- und Sensortechnik e.V. Meinsberg, Germany
Stephen Wren, City University London, UK
Dongfang Yang, National Research Council Canada - London, Canada
Dan Yaping, Harvard University, USA
Alberto Yúfera, Seville Microelectronics Institute (IMSE-CNM), Spain
Sergey Y. Yurish, International Frequency Sensor Association (IFSA), Spain
Cyrus Zamani, University of Barcelona, Spain
Dan Zhang, University of Ontario Institute of Technology, Canada
Weiping Zhang, Shanghai Jiao Tong University, P. R. China
Ya-Pu Zhao, Chinese Academy of Sciences - Beijing, China
Daniele Zonta, University of Trento, Italy