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The Second International Conference on Advances in System Testing and Validation Lifecycle VALID 2010 August 22-27, 2010 - Nice, France |
| Committees |
VALID Advisory Chairs
Amirhossein Alimohammad, Ukalta Engineering/CTO, Canada
Andrea Baruzzo, Università degli Studi di Udine, Italy
Lydie du Bousquet, Laboratoire d'Informatique de Grenoble (LIG), France
Petre Dini, Concordia University, Canada / IARIA
Henry Muccini, University of L'Aquila, Italy
VALID 2010 Research Institute Liaison Chairs
Alexander Klaus, Fraunhofer Institute for Experimental Software Engineering (IESE), Germany
Juho Perälä, VTT Technical Research Centre of Finland, Finland
VALID 2010 Industry/Research Liaison Chairs
Davide Pandini, STMicroelectronics - Agrate Brianza, Italy
Juho Perälä, VTT Technical Research Centre of Finland, Finland
Raj Senguttuvan, Texas Instruments - Dallas, USA
Avik Sinha, IBM TJ Watson Research Center - Hawthorne, USA
Alin Stefanescu, University of Pitesti, Romania
Bart Vermeulen, NXP Semiconductors, The Netherlands
VALID 2010 Special Area Chairs
Testing of wireless communications systems
Amirhossein Alimohammad, Ukalta Engineering/CTO, Canada
Testing and validation of run-time evolving systems
Stefan van Baelen, KU Leuven Belgium
Hans-Gerhard Gross, Delft University of Technology, The Netherlands
VALID 2010 Technical Program Committee
Fredrik Abbors, Åbo Akademi University - Turku, Finland
Noureddine Adjir, University of Saida, Algeria
Amirhossein Alimohammad, Ukalta Engineering/CTO, Canada
Giner Alor Hernandez, Instituto Tecnologico de Orizaba, México
César Andrés Sánchez, Universidad Complutense de Madrid, España
Alberto Bacchelli, Università della Svizzera Italiana, Switzerland
Cesare Bartolini, Scuola Superiore Sant'Anna / ISTI - CNR, Pisa, Italy
Andrea Baruzzo, Università degli Studi di Udine, Italy
Domenico Bianculli, Università della Svizzera Italiana, Switzerland
Robert V. Binder, Systems Verification Associates, Chicago, USA
Alberto Bosio, LIRMM - University of Montpellier 2, France
Thierry Coq, DNV, Norway
Roberta de Souza Coelho, Federal University of Rio Grande do Norte, UFRN, Brazil
Florian Deissenboeck, Technische Universität München, Germany
Stefano Di Carlo, Politecnico di Torino, Italy Jon Hall, Open University, UK
Lydie du Bousquet, Laboratoire d'Informatique de Grenoble (LIG) , France
Khaled El-Fakih, American University of Sharjah, UAE
Robert Eschbach, Fraunhofer IESE - Kaiserslautern, Germany
Eitan Farchi, IBM Haifa Research Laboratory, Israel
Gordon Fraser, Saarland University, Germany
Patrick Girard, LIRMM, France
Hans-Gerhard Gross, Delft University of Technology, The Netherlands
Kazumi Hatayama, Semiconductor Technology Academic Research Center (STARC) - Yokoham, Japan
Florentin Ipate, University of Pitesti, Romania
David Kaeli, Northeastern University - Boston, USA
Alexander Klaus, Fraunhofer Institute for Experimental Software Engineering (IESE), Germany
Daniel Larsson, Cybercom Sweden South AB, Sweden
Abel Marrero Pérez , Daimler Center for Automotive IT Innovations - Berlin , Germany
Atif M. Memon, University of Maryland-College Park, USA
Mercedes G. Merayo, Universidad Complutense de Madrid, Spain
Jani Metsä, Tampere University of Technology, Finland
Tommi Mikkonen, Tampere University of Technology, Finland
Henry Muccini, University of L'Aquila, Italy
Krishna Murthy, Infosys, USA
Roy Oberhauser, Aalen University, Germany
Davide Pandini, STMicroelectronics - Agrate Brianza, Italy
Juho Perälä, VTT Technical Research Centre of Finland, Finland
Eric Piel, Delft University of Technology, The Netherlands
Miodrag Potkonjak, Univeristy of California, Los Angeles (UCLA), USA
Amit Prakash Singh, USIT/GGSIPU - Delhi, India
Wishnu Prasetya, Utrecht University, The Netherlands
Paolo Prinetto, Politecnico di Torino, Italy
Henrique Rebêlo, Federal University of Pernambuco, Brazil
Michel Renovell, LIRMM, France
Filippo Ricca, Università di Genova, Italy
Thomas Rings, University of Göttingen, Germany
Rosa Rodriguez, Universitat Politècnica de Catalunya, Spain
Daniel Romero, Universidad Politécnica de Valencia, Spain
Cristina Seceleanu, Mälardalen University, Sweden
Raj Senguttuvan, Cornell University, USA
Avik Sinha, IBM TJ Watson Research Center - Hawthorne, USA
Sérgio Soares, Federal University of Pernambuco, Brazil
Alin Stefanescu, University of Pitesti, Romania
Mehdi B. Tahoori, Northeastern University - Boston, USA
Nur Touba, University of Texas at Austin, USA
Spyros Tragoudas, Southern Illinois University Carbondale, USA
Dragos Truscan, Åbo Akademi University - Turku, Finland
Shmuel Ur, IBM-Haifa, Israel
Bart Vermeulen, NXP Semiconductors, The Netherlands
Arnaud Virazel, LIRMM - University of Montpellier 2, France
Tanja Vos, Technical University of Valencia, Spain
Stefan Wagner, Technische Universität München, Germany
Melanie Ware, University of Ulster - Jordanstown, UK
Martin Weiglhofer, Graz University of Technology, Austria
Weixin Wu, Intel, USA
Cemal Yilmaz , Sabanci University - Istanbul, Turkey
Testing and validation of run-time evolving systems track
Mehmet Aksit, University of Twente, The Netherlands
Christian Bunse, University of Mannheim, Germany
Hans-Gerhard Gross, Delft University of Technology, The Netherlands
Toine Hurkmans, Exact, The Netherlands
Teemu Kanstren, VTT, Finland
Philippe Lahire, University of Nice / Sophia Antipolis, France
Marco Lormans, Logica, The Netherlands
Julio Medina, University of Cantabria, Spain
Adam Nasr, Logica, The Netherlands
Eric Piel, Delft University of Technology, The Netherland
Goiuria Sagardui, Mondragon University, Spain
Jan Tretmans, Radboud University Nijmegen & Embedded Systems Institute Eindhoven, The Netherlands
Stefan van Baelen, KU Leuven Belgium
Mark van Dijk, Exact, The Netherlands
Testing of Wireless Communication Systems track
Bruce F. Cockburn, University of Alberta, Canada
S. Venkatesan, University of Texas at Dallas, USA
Larry Zhang, Texas Instruments, USA
Zeljko Zilic, McGill University, Canada
