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The Ninth International Conference on Advances in VALID 2017 |
| Awards |
The papers listed below have been selected as "Best Papers" based on the reviews of the original submission, the camera-ready version, and the presentation during the conference. For the awarded papers, a digital award will be issued in the name of the authors. The authors of these papers are also receiving invitations to submit an extended article version to one of the IARIA Journals.
Awarded Papers
A Method to Determine the Static NBTI Stress Time of an Embedded Component in an Integrated Circuit
Puneet Ramesh Savanur, Spyros Tragoudas
The following papers have been selected on the basis of their contents, specificaly for lending themselves to an interesting extended work. The authors of these papers are receiving invitations to submit an extended article version to one of the IARIA Journals.
Papers Invited for IARIA Journals
The Applicability of Testing Techniques
Jos van Rooyen
Improvement of Sequential Tests in IEC-61124 Reliability Testing – Compliance Tests for Constant Failure Rate
Ofer Shaham, Yefim Haim Michlin
