 |
The Ninth International Conference on Advances in VALID 2017 |
| Committees |
VALID Steering Committee
Andrea Baruzzo, IDS Interaction Design Solutions, Italy
Tadashi Dohi, Hiroshima University, Japan
Roy Oberhauser, Aalen University, Germany
Patrick Girard, LIRMM / CNRS, France
Stefan Wagner, University of Stuttgart, Germany
Hiroyuki Sato, University of Tokyo, Japan
Mehdi Tahoori, Karlsruhe Institute of Technology (KIT), Germany
Hironori Washizaki, Waseda University, Japan
VALID Industry/Research Advisory Committee
Xinli Gu, Huawei, USA
Sigrid Eldh, Ericsson AB, Sweden
Jos van Rooyen, Identify - Software Quality Services, the Netherlands
Miroslav N. Velev, Aries Design Automation, USA
Philipp Helle, Airbus Group Innovations, Germany
VALID 2017 Technical Program Committee
Wasif Afzal, Mälardalen University, Sweden
Amir Alimohammad, San Diego State University, USA
María Alpuente, Technical University of Valencia (UPV), Spain
Aitor Arrieta, University of Mondragon, Spain
Sebastien Bardin, CEA LIST | Paris Saclay, France
Cesare Bartolini, ISTI - CNR, Pisa, Italy
Andrea Baruzzo, IDS Interaction Design Solutions, Italy
Ateet Bhalla, Independent Consultant, India
Bruno Blaskovic, University of Zagreb, Croatia
Mohamed Boussaa, University of Rennes 1 | INRIA, France
Mark Burgin, University of California Los Angeles (UCLA), USA
Adnan Causevic, Researcher at Mälardalen University, Sweden
Federico Ciccozzi, Mälardalen University, Sweden
Bruce Cockburn, University of Alberta, Canada
Gulsen Demiroz, Sabanci University, Istanbul, Turkey
Dario Di Nucci, University of Salerno, Italy
Tadashi Dohi, Hiroshima University, Japan
Dimitris Dranidis, CITY College | International Faculty of the University of Sheffield, Greece
Rolf Drechsler, University of Bremen/DFKI, Germany
Lydie du Bousquet, Université Grenoble-Alpes (UGA), France
Sigrid Eldh, Ericsson AB, Sweden
Jicheng Fu, University of Central Oklahoma, USA
Gregory Gay, University of South Carolina, USA
Patrick Girard, LIRMM / CNRS, France
Xinli Gu, Huawei, USA
Bidyut Gupta, Southern Illinois University, Carbondale, USA
Kazumi Hatayama, Gunma University, Japan
Philipp Helle, Airbus Group Innovations, Germany
Hassan Ibrahim, Université Paris Sud, Université Paris Saclay, France
David Kaeli, Northeastern University, Boston , USA
Ahmed Kamel, Offutt School of Business | Concordia College, USA
Marouane Kessentini, University of Michigan - Dearborn, USA
Takashi Kitamura, National Institute of Advanced Industrial Science and Technology (AIST), Japan
Diego Kreutz, University of Luxembourg, Luxembourg / Federal University of Pampa, Brazil
Maurizio Leotta, University of Genova, Italy
Lei Ma, Harbin Institute of Technology, China
Abel Marrero, Bombardier Transportation Signal Germany GmbH, Germany
Rivalino Matias Jr., Federal University of Uberlandia, Brazil
Roy Oberhauser, Aalen University, Germany
Pablo Oliveira Antonino, Fraunhofer IESE, Germany
Roberto Pietrantuono, Università di Napoli Federico II, Italy
Pasqualina Potena, RISE SICS Västerås, Sweden
Paolo Prinetto, Politecnico di Torino, Italy
Oliviero Riganelli, University of Milano Bicocca, Italy
Mehrdad Saadatmand, RISE SICS Västerås, Sweden
Giedre Sabaliauskaite, iTrust Centre for Research in Cyber Security | Singapore University of Technology and Design, Singapore
Hiroyuki Sato, University of Tokyo, Japan
Sibylle Schupp, Hamburg University of Technology (TUHH), Germany
Josep Silva Galiana, Technical University of Valencia, Spain
Andrea Stocco, University of British Columbia - Vancouver, Canada
Mehdi Tahoori, Karlsruhe Institute of Technology (KIT), Germany
Nur Touba, University of Texas at Austin, USA
Spyros Tragoudas, Southern Illinois University, USA
Jos van Rooyen, Identify - Software Quality Services, the Netherlands
Miroslav N. Velev, Aries Design Automation, USA
Stefan Wagner, University of Stuttgart, Germany
Hironori Washizaki, Waseda University / National Institute of Informatics / SYSTEM INFORMATION, Japan
Kristian Wiklund, Ericsson AB, Sweden
Robert Wille, Johannes Kepler University Linz, Austria
Cemal Yilmaz, Sabanci University, Istanbul, Turkey
Haibo Yu, Shanghai Jiao Tong University, China
